Numerical Field Calculation for Charged Particle Optics
Erwin Kasper (Eds.)
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Kategori:
Tahun:
2001
Edisi:
1
Penerbit:
Elsevier, Academic Press
Bahasa:
english
Halaman:
1
ISBN 10:
0120147580
ISBN 13:
9780120147588
Nama siri:
Advances in Imaging and Electron Physics 116
Fail:
PDF, 16.42 MB
IPFS:
,
english, 2001
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