Particle characterization in technology vol II Morphological Analysis
Beddow, John KeithKategori:
Tahun:
1985
Edisi:
2. print
Penerbit:
CRC Press
Bahasa:
english
Halaman:
265
ISBN 10:
1351075365
ISBN 13:
9781351075367
Nama siri:
CRC series on fine particle science and technology
Fail:
PDF, 6.43 MB
IPFS:
,
english, 1985